Profile
Semiconductor metrology and inspection equipment
icspi designs, manufactures and sells high-throughput atomic force microscope (AFM) systems, powered by proprietary microAFM technology that miniaturizes an entire AFM onto a 1 mm² chip. Parallel microAFM arrays deliver 100x throughput for semiconductor metrology and inspection, targeting advanced packaging (hybrid bonding). icspi has hundreds of customers for its desktop AFMs. In February 2026, it demonstrated the first 20-scan-head AFM with imec.
Products and Services
High-throughput atomic force microscope (AFM) systems for semiconductor metrology and inspection (seeking early customers for 300-mm multiAFM fab tool).
Website
icspicorp.comContact
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Jorge Marcano, Electrical EngineerTel: +1 438-499-7700Email: jorge@icspicorp.com
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Zhenle Cao, Technical AdvisorTel: +1 617-356-5759Email: zhenle@icspicorp.com
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Event details
Date: August 31 - September 4, 2026
Event contact
Lisa Qi
Senior International Market Consultant
Greater China, Australia & New Zealand
Tel: +1 416-843-4382
Email: lisa.qi@ontario.ca
Participants
9 in total
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